http://www.mysite.com Get the lates news from my very interesting site! http://scemcd.gov.in/publ.php?mnid=1 Salil P, Subbarao B, VISION 2010, Indian Society Of Lighting Engineers, November 22-23, 2008 Abstract: With lighting devices becoming more and more dependent on electronic circuits, EMC is a major concern that the manufactures face. In this paper the sources of EMC, test methods and standards are discussed in brief. Also various elements of the EMC test laboratories are mentioned. With the design engineers ignoring the EMC aspects in their products, all of the issues are accumulated till the final product testing. The design approach in this case is also mentioned. http://scemcd.gov.in/publ.php?mnid=2 Santhosh Kumar P., Salil P., Subbarao B., International Conference on Electromagnetic Interference and Compatibility, Bangalore, Nov 2008 Abstract: It is common for the Equipment Under Test (EUT) to have multiple input power ports. The international commercial standards on conducted emission (CE) specifies only about the measurement of the noise at individual power supply ports using Line Impedance Stabilization Network (LISN). The effect of the power supply ports other than the one which is tested, such as the noise getting on to the system via the other power supply ports or the low impedance path for the noise through the other ports bypassing the LISN, is often ignored. It is observed that the impedance at other power supply ports has a major influence on the noise measurement at the test port. In this paper effort is made to demonstrate the effect of other power supply ports on the test measurement. The measurement results with different configurations are presented here. The observations may be referred to the standard setting committee and considered for possible amendment in the standard during the revision. http://scemcd.gov.in/publ.php?mnid=3 G. Mahesh, B. Subbarao, S. Karunakaran, International Conference on Electromagnetic Interference and Compatibility, Bangalore, November 26-27, 2008 Abstract: Conducted Emission (CE) measurement for AC operated equipment is carried out to quantify the amount of noise / interference generated by Equipment Under Test (EUT) and sent back to power supply input terminal through power cable. The increased use of non linear devices has resulted in increased ‘power harmonics’ and thus degradation of power quality. The interference generated by the EUT will not only depend on its internal source (electronics) but also will depend on the input AC mains power quality. The presence of voltage harmonics at line impedance stabilization network (LISN) output significantly affects the conducted emission generated by EUT. This paper establishes the effect of voltage harmonics on CE measurement with experimental results and data. It also stresses the need for specification of maximum allowable voltage Total Harmonic Distortion (THD) in Electromagnetic Compatibility (EMC) standards. http://scemcd.gov.in/publ.php?mnid=4 Bharathidasan. J, Sanjay Baisakhiya, Dr. B. Subbarao,International Conference on Electromagnetic Interference and Compatibility, Bangalore, November 26-27, 2008 Abstract: As per international regulatory bodies on electromagnetic compatibility (EMC) every electrical /electronic product need to be tested for electromagnetic compliance. There are several emission / immunity standards set up to meet these requirements. AmongIEC61000-4-3 is a EMC standard which looks after the radiated immunity (RI) compliance. This standard specifies the calibration / test procedures for RI test, the test procedures mentioned in this standard cannot be executed perfectly by a test engineer manually since the standard specifies the dwell time to be maintained during the test for each and every spot frequency. Hence there arises the need to have an automated setup for radiated immunity test as per IEC61000-4-3. http://scemcd.gov.in/publ.php?mnid=5 R. Sivaramakrishnan, S. Santhakumari, R. Dhivya, S.Parthiban, L.N. Charyulu,International Conference on Electromagnetic Interference and Compatibility, Bangalore, November 26-27, 2008 Abstract: IEC 61000-4-6 relates to the conducted immunity requirement to electrical and electronics equipment to electromagnetic disturbances coming from intended RF sources in the frequency range of 150 kHz to 80 MHz. The standard defines different injection methods for applying RF stress level over the test frequency range. The purpose of the test is significant when the impedance of the disturbance source during setting the stress level and during the test is same. Variation in common mode impedance causes variation in injected stress level. This paper points out the inefficiency in the injection methods for stabilizing the impedance and practical results are shown.